FreeCalypso > hg > freecalypso-sw
view gsm-fw/riviera/tests/rv/rv_test_regr.h @ 923:10b4bed10192
gsm-fw/L1: fix for the DSP patch corruption bug
The L1 code we got from the LoCosto fw contains a feature for DSP CPU load
measurement. This feature is a LoCosto-ism, i.e., not applicable to earlier
DBB chips (Calypso) with their respective earlier DSP ROMs. Most of the
code dealing with that feature is conditionalized as #if (DSP >= 38),
but one spot was missed, and the MCU code was writing into an API word
dealing with this feature. In TCS211 this DSP API word happens to be
used by the DSP code patch, hence that write was corrupting the patched
DSP code.
author | Mychaela Falconia <falcon@ivan.Harhan.ORG> |
---|---|
date | Mon, 19 Oct 2015 17:13:56 +0000 |
parents | afceeeb2cba1 |
children |
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/** * @file rv_test_regr.h * * Definitions used for non-regression tests. * * @author Cedric Baudelet * @author Vincent Oberle */ /* * History: * * Date Author Modification * ------------------------------------------------------------------- * 09/29/00 Cedric Baudelet Create. * 03/15/02 Vincent Oberle Passed all remaining macros into function. * Comment and formating cleaning. * * (C) Copyright 2002 by Texas Instruments Incorporated, All Rights Reserved */ #ifndef _RV_TEST_REGR_H_ #define _RV_TEST_REGR_H_ #include "tests/rv/rv_test.h" #ifdef __cplusplus extern "C" { #endif /* * DO NOT MODIFY THIS FILE! * Add your test in the corresponding .c file only. */ /** * Define the MAX number of tests which it will be possible to execute during * the regression. */ #define MAX_NB_OF_TEST_TO_PASS (200) /** Non-Regression test error type */ typedef T_RV_TEST_ERR_TYPE T_RV_REGR_ERR_TYPE; /** Non-Regression test return value type */ typedef T_RV_TEST_RET T_RV_REGR_RET; /** Non-Regression test configuration parameter */ typedef enum { TEST_LIST = 0, /* Allows to execute chosen tests */ TEST_LIST_RAND = -2, /* Allows to execute rand chosen tests */ TEST_ALL = -3, /* Allows to execute all tests available */ TEST_ALL_RAND = -4 /* Allows to execute rand all tests available */ } T_RV_REGR_TEST_CFG; /** Non-Regression test list contents */ typedef UINT8 T_RV_REGR_TEST_LIST_NBR; typedef UINT8 T_RV_REGR_TEST_LIST_CFG; #define CONFIG_A (0) /* DEVICE_A = SOURCE & DEVICE_B = TARGET */ #define CONFIG_B (1) /* DEVICE_A = TARGET & DEVICE_B = SOURCE */ typedef struct { T_RV_REGR_TEST_LIST_NBR list_nbr; /* Number of the executed test */ T_RV_REGR_TEST_LIST_CFG list_cfg; /* Configuration of the executed test */ } T_RV_REGR_TEST_LIST; /** Non-Regression test total number of tests */ typedef UINT16 T_RV_REGR_TEST_TOT; /** Non-Regression test nb of occurence of each test */ typedef UINT8 T_RV_REGR_TEST_OCC; /** Non-Regression test initialization parameter */ #define RV_REGR_RAND_INIT (1) #ifdef __cplusplus } #endif #endif /* _RV_TEST_REGR_ */