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comparison chipsetsw/riviera/tests/rv/rv_test_cfg.h @ 0:509db1a7b7b8

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initial import: leo2moko-r1
author Space Falcon <falcon@ivan.Harhan.ORG>
date Mon, 01 Jun 2015 03:24:05 +0000
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-1:000000000000 0:509db1a7b7b8
1 /**
2 * @file rv_test_cfg.h
3 *
4 * This file allows to set parameters used to perform tests.
5 *
6 * Parameters to set are:
7 * - TEST_INIT (to set parameters statically or dynamically)
8 * - TEST_TYPE
9 * - TEST_LEVEL
10 * - TEST_NUMBER
11 * - TEST_CFG (non regression)
12 * - TEST_TABLE (non regression)
13 * - NB_OF_TEST_TO_PASS (non regression)
14 * - TEST_OCC (non regression)
15 *
16 * It is also possible to set bd_addr used for the tests by
17 * setting BD_ADDR_LOC and BD_ADDR_REM values at the end of this file.
18 *
19 * IMPORTANT: Copy contents of rv_test_cfg_template.h
20 * file into this file before building.
21 *
22 * @author Cedric Baudelet
23 * @author Vincent Oberle
24 */
25
26 #ifndef _RV_TEST_CFG_H_
27 #define _RV_TEST_CFG_H_
28
29 #include "rv_test_regr.h"
30
31
32 /**
33 *
34 * Define TEST_INIT parameter.
35 *
36 * TEST_INIT parameter's available values are:
37 *
38 * -> COMP: Set testing parameters statically during compilation using
39 * rv_test_cfg file.
40 * -> EXEC: Set testing parameters dynamically during execution using LCD
41 * and keypad.
42 *
43 */
44 #define TEST_INIT (EXEC)
45
46
47
48 /*
49 * Only with TEST_INIT = COMP
50 * --------------------------
51 */
52
53 /**
54 *
55 * Define TEST_TYPE parameter.
56 *
57 * TEST_TYPE parameter's available values are:
58 *
59 * -> REGR: Execute NON REGRESSION tests.
60 * -> CERTIF: Execute CERTIFICATION tests.
61 * -> DEMO: Execute DEMONSTRATION events.
62 * -> MISC: Execute MISCELLANEOUS tests.
63 * -> UPF4: Execute UPF4 tests.
64 *
65 */
66 #define TEST_TYPE (MISC)
67
68
69
70 /**
71 *
72 * Define TEST_LEVEL parameter.
73 *
74 * TEST_LEVEL parameter is TEST_XXX_SWE, where XXX can take one of the
75 * following values:
76 *
77 * REGR:
78 * | L2CAP RFCOMM SPP SDP SDAP ATP
79 * | HS OBX OPP EXPL FFS SYN
80 * | DAR PWR TUT
81 * |______________________________________________________________
82 *
83 * CERTIF:
84 * | L2CAP SDP SPP
85 * |______________________________________________________________
86 *
87 * DEMO:
88 * | HS EXPL RNET TUT R2D
89 * |______________________________________________________________
90 *
91 * MISC:
92 * | BTE SDP HCI SPP BTCTRL DUN_GW
93 * | ATP TCS FFS BMI SCM
94 * | RTC AUDIO R2D KPD TUT MKS
95 * | RGUI RNET UVM MSME
96 * |______________________________________________________________
97 *
98 * UPF4:
99 * | L2CAP RFCOMM SDP SPP BTCTRL DUN_GW
100 * | OPP FAX_GW
101 * |______________________________________________________________
102 *
103 */
104 #define TEST_LEVEL (TEST_MSME_SWE)
105
106
107 /**
108 *
109 * Define TEST_NUMBER parameter.
110 *
111 * This parameter should not be used with REGR TEST_TYPE (except if
112 * TEST_TABLE[] = {TEST_NUMBER, CONFIG_X, EOL}.
113 *
114 */
115 #define TEST_NUMBER (5)
116
117
118
119 /*
120 * Only with TEST_MISC = REGR
121 * --------------------------
122 */
123
124 /**
125 *
126 * Define TEST_CFG parameter.
127 *
128 * TEST_CFG parameter's available values are:
129 *
130 * -> TEST_LIST: Execute all scenarios from TEST_TABLE[] sequentially.
131 * -> TEST_LIST_RAND: Execute NB_OF_TEST_TO_PASS scenarios from TEST_TABLE[] randomly.
132 * -> TEST_ALL: Execute all the scenarios sequentially using the two
133 * regression configurations (CONFIG_A and CONFIG_B).
134 * -> TEST_ALL_RAND: Execute NB_OF_TEST_TO_PASS scenarios randomly using the
135 * two regression configurations (CONFIG_A and CONFIG_B).
136 *
137 * Note:
138 * If TEST_INIT = EXEC, test_cfg parameter (defined in rv_test.c file) is
139 * automatically set to TEST_ALL_RAND value.
140 *
141 */
142 #define TEST_CFG (TEST_ALL_RAND)
143
144
145 /**
146 *
147 * Define TEST_TABLE parameter.
148 *
149 * T_RV_REGR_TEST_LIST type is:
150 * -> T_RV_REGR_TEST_LIST_NBR: Scenario number.
151 * -> T_RV_REGR_TEST_LIST_CFG: Test configuration (CONFIG_A or CONFIG_B)
152 *
153 * Note:
154 * TEST_TABLE MUST contain EOL flag as its last element.
155 *
156 */
157 static const T_RV_REGR_TEST_LIST TEST_TABLE[] = {TEST_NUMBER, CONFIG_A, TEST_NUMBER, CONFIG_B,
158 EOL};
159
160 /**
161 *
162 * Define NB_OF_TEST_TO_PASS parameter.
163 *
164 * This parameter is only used with REGR TEST_TYPE when TEST_CFG parameter is
165 * set to TEST_LIST_RAND or TEST_ALL RAND. Else not used.
166 *
167 */
168 #define NB_OF_TEST_TO_PASS (1)
169
170
171 /**
172 *
173 * Define TEST_OCC parameter.
174 *
175 * This parameter defines the number of occurence for each test.
176 *
177 * Note:
178 * This parameter can't be set dynamically.
179 *
180 */
181 #define TEST_OCC (1)
182
183
184 /*
185 * Only with TEST LEVEL = AUDIO
186 * ----------------------------
187 */
188
189 /**
190 *
191 * Define TEST_AUDIO parameter.
192 *
193 * TEST_AUDIO parameter's available values are:
194 * -> LIST: to test all the Keybeep or Tones or Melody or Voice memo Tests
195 * -> ONESHOT: to test just one audio test
196 */
197 #define TEST_AUDIO (ONESHOT)
198
199
200
201 /*
202 * Only with BT devices
203 * --------------------
204 */
205
206 /**
207 *
208 * bd_addr of BT devices used to execute tests.
209 *
210 * Note that in case where two separated devices are used, BD_ADDR_LOC and
211 * BD_ADDR_REM values shouldn't depend on DEVICE_A or DEVICE_B.
212 *
213 */
214
215 #ifdef DEVICE_A
216 #define BD_ADDR_LOC {0x00, 0xD0, 0xB7, 0x03, 0x17, 0x26}
217 #define BD_ADDR_REM {0x00, 0xD0, 0xB7, 0x03, 0x17, 0x48}
218 #endif
219 #ifdef DEVICE_B
220 #define BD_ADDR_LOC {0x00, 0xD0, 0xB7, 0x03, 0x17, 0x48}
221 #define BD_ADDR_REM {0x00, 0xD0, 0xB7, 0x03, 0x17, 0x26}
222 #endif
223
224
225 #endif /* _RV_TEST_CFG_H_ */