--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/chipsetsw/riviera/tests/rv/rv_test_cfg.h	Mon Jun 01 03:24:05 2015 +0000
@@ -0,0 +1,225 @@
+/**
+ * @file	rv_test_cfg.h
+ *
+ * This file allows to set parameters used to perform tests.
+ *
+ * Parameters to set are:
+ * - TEST_INIT (to set parameters statically or dynamically)
+ * - TEST_TYPE
+ * - TEST_LEVEL
+ * - TEST_NUMBER
+ * - TEST_CFG (non regression)
+ * - TEST_TABLE (non regression)
+ * - NB_OF_TEST_TO_PASS (non regression)
+ * - TEST_OCC (non regression)
+ *
+ * It is also possible to set bd_addr used for the tests by
+ * setting BD_ADDR_LOC and BD_ADDR_REM values at the end of this file.
+ *
+ * IMPORTANT: Copy contents of rv_test_cfg_template.h
+ * file into this file before building.
+ *
+ * @author	Cedric Baudelet
+ * @author	Vincent Oberle
+ */
+
+#ifndef _RV_TEST_CFG_H_
+#define _RV_TEST_CFG_H_
+
+#include "rv_test_regr.h"
+
+
+/**
+ *
+ * Define TEST_INIT parameter.
+ *
+ * TEST_INIT parameter's available values are:
+ *
+ * -> COMP:   Set testing parameters statically during compilation using
+ *            rv_test_cfg file.
+ * -> EXEC:   Set testing parameters dynamically during execution using LCD
+ *            and keypad.
+ *
+ */
+#define TEST_INIT (EXEC)
+
+
+
+/*
+ * Only with TEST_INIT = COMP
+ * --------------------------
+ */
+
+/**
+ *
+ * Define TEST_TYPE parameter.
+ *
+ * TEST_TYPE parameter's available values are:
+ *
+ * -> REGR:   Execute NON REGRESSION tests.
+ * -> CERTIF: Execute CERTIFICATION tests.
+ * -> DEMO:   Execute DEMONSTRATION events.
+ * -> MISC:   Execute MISCELLANEOUS tests.
+ * -> UPF4:   Execute UPF4 tests.
+ *
+ */
+#define TEST_TYPE (MISC)
+
+
+
+/**
+ *
+ * Define TEST_LEVEL parameter.
+ *
+ * TEST_LEVEL parameter is TEST_XXX_SWE, where XXX can take one of the
+ * following values:
+ *
+ * REGR:
+ * |    L2CAP     RFCOMM    SPP       SDP       SDAP      ATP
+ * |    HS        OBX       OPP       EXPL      FFS       SYN
+ * |    DAR       PWR       TUT
+ * |______________________________________________________________
+ *
+ * CERTIF:
+ * |    L2CAP     SDP       SPP
+ * |______________________________________________________________
+ *
+ * DEMO:
+ * |    HS        EXPL      RNET      TUT		R2D
+ * |______________________________________________________________
+ *
+ * MISC:
+ * |    BTE       SDP       HCI       SPP       BTCTRL    DUN_GW
+ * |    ATP       TCS       FFS       BMI       SCM
+ * |    RTC       AUDIO     R2D       KPD       TUT       MKS
+ * |    RGUI      RNET      UVM       MSME
+ * |______________________________________________________________
+ *
+ * UPF4:
+ * |    L2CAP     RFCOMM    SDP       SPP       BTCTRL    DUN_GW
+ * |    OPP       FAX_GW
+ * |______________________________________________________________
+ *
+ */
+#define TEST_LEVEL (TEST_MSME_SWE)
+
+
+/**
+ *
+ * Define TEST_NUMBER parameter.
+ *
+ * This parameter should not be used with REGR TEST_TYPE (except if
+ * TEST_TABLE[] = {TEST_NUMBER, CONFIG_X, EOL}.
+ *
+ */
+#define TEST_NUMBER (5)
+
+
+
+/*
+ * Only with TEST_MISC = REGR
+ * --------------------------
+ */
+
+/**
+ *
+ * Define TEST_CFG parameter.
+ *
+ * TEST_CFG parameter's available values are:
+ *
+ * -> TEST_LIST:      Execute all scenarios from TEST_TABLE[] sequentially.
+ * -> TEST_LIST_RAND: Execute NB_OF_TEST_TO_PASS scenarios from TEST_TABLE[] randomly.
+ * -> TEST_ALL:       Execute all the scenarios sequentially using the two
+ *                    regression configurations (CONFIG_A and CONFIG_B).
+ * -> TEST_ALL_RAND:  Execute NB_OF_TEST_TO_PASS scenarios randomly using the
+ *                    two regression configurations (CONFIG_A and CONFIG_B).
+ *
+ * Note:
+ *    If TEST_INIT = EXEC, test_cfg parameter (defined in rv_test.c file) is
+ *    automatically set to TEST_ALL_RAND value.
+ *
+ */
+#define TEST_CFG (TEST_ALL_RAND)
+
+
+/**
+ *
+ * Define TEST_TABLE parameter.
+ *
+ * T_RV_REGR_TEST_LIST type is:
+ * -> T_RV_REGR_TEST_LIST_NBR: Scenario number.
+ * -> T_RV_REGR_TEST_LIST_CFG: Test configuration (CONFIG_A or CONFIG_B)
+ *
+ * Note:
+ *    TEST_TABLE MUST contain EOL flag as its last element.
+ *
+ */
+static const T_RV_REGR_TEST_LIST TEST_TABLE[] = {TEST_NUMBER, CONFIG_A, TEST_NUMBER, CONFIG_B,
+                                                 EOL};
+
+/**
+ *
+ * Define NB_OF_TEST_TO_PASS parameter.
+ *
+ * This parameter is only used with REGR TEST_TYPE when TEST_CFG parameter is
+ * set to TEST_LIST_RAND or TEST_ALL RAND. Else not used.
+ *
+ */
+#define NB_OF_TEST_TO_PASS (1)
+
+
+/**
+ *
+ * Define TEST_OCC parameter.
+ *
+ * This parameter defines the number of occurence for each test.
+ *
+ * Note:
+ *    This parameter can't be set dynamically.
+ *
+ */
+#define TEST_OCC (1)
+
+
+/*
+ * Only with TEST LEVEL = AUDIO
+ * ----------------------------
+ */
+
+/**
+ *
+ * Define TEST_AUDIO parameter.
+ *
+ * TEST_AUDIO parameter's available values are:
+ * -> LIST:     to test all the Keybeep or Tones or Melody or Voice memo Tests
+ * -> ONESHOT:  to test just one audio test
+ */
+#define TEST_AUDIO (ONESHOT)
+
+
+
+/*
+ * Only with BT devices
+ * --------------------
+ */
+
+/**
+ *
+ * bd_addr of BT devices used to execute tests.
+ *
+ * Note that in case where two separated devices are used, BD_ADDR_LOC and
+ * BD_ADDR_REM values shouldn't depend on DEVICE_A or DEVICE_B.
+ *
+ */
+
+#ifdef DEVICE_A
+   #define BD_ADDR_LOC {0x00, 0xD0, 0xB7, 0x03, 0x17, 0x26}
+   #define BD_ADDR_REM {0x00, 0xD0, 0xB7, 0x03, 0x17, 0x48}
+#endif
+#ifdef DEVICE_B
+   #define BD_ADDR_LOC {0x00, 0xD0, 0xB7, 0x03, 0x17, 0x48}
+   #define BD_ADDR_REM {0x00, 0xD0, 0xB7, 0x03, 0x17, 0x26}
+#endif
+
+
+#endif /* _RV_TEST_CFG_H_ */