view g23m/system/busyb/sourcesets/die_test.xml @ 158:90c4afec6608

l1_trace.c: use of int_id global var reconstructed
author Mychaela Falconia <falcon@freecalypso.org>
date Sun, 05 Jun 2016 19:36:56 +0000
parents 509db1a7b7b8
children
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<?xml version="1.0" encoding="utf-8"?>
<sourceSet description="DIE (access to eFuses chip) Tests" name="die">
  <settings>
    <options>
      <optionDef description="Settings (from optionSet)" name="">
        <condOption optRef="TI_INCLUDES" />
        <condOption name="include">
          <condValue pathRef="DRIVERS_APP_DIR" />
        </condOption>
      </optionDef>
      <optionDef description="Common option flags" name="">
        <condOption optRef="die_flags" />
      </optionDef>
    </options>
  </settings>
  <sourceDirs>
    <srcDir path="" pathRef="DIE_DIR" />
    <expDir path="" pathRef="" />
  </sourceDirs>
  <sourceFiles>
    <source name="tests/die_test_regr.c" />
    <source name="tests/die_test_misc.c" />
    <source name="tests/die_test_misc0.c" />
    <source name="tests/die_test_misc1.c" />
    <source name="tests/die_test_misc2.c" />
  </sourceFiles>
</sourceSet>